Large-scale analysis of high-speed atomic force microscopy data sets using adaptive image processing

• Blake W. Erickson,
• Séverine Coquoz,
• Jonathan D. Adams,
• Daniel J. Burns and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2012, 3, 747–758, doi:10.3762/bjnano.3.84

• applicable to all channels of AFM data, and can process images in seconds. Keywords: adaptive algorithm; artifact correction; atomic force microscopy; high-speed atomic force microscope; image processing; Introduction Atomic force microscopes (AFMs) are a useful tool for investigating nanoscale surfaces

• in the image. Panel E shows the raw data of a mixed lipid bilayer on mica. Panel F shows the results of line-by-line second-order polynomial subtraction. Panel G shows 1-D artifact correction followed by 2-D second-order polynomial subtraction. Panel H shows the results of 1-D artifact correction

• detection followed by median correction and a median-difference correction is applied. This corrects for line skips in the source image. Following the 1-D artifact correction, a global correction is applied. The primary function is to remove overall sample tilt and some second-order distortions. The image